- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/319 - Tester hardware, i.e. output processing circuits
Patent holdings for IPC class G01R 31/319
Total number of patents in this class: 982
10-year publication summary
|
80
|
63
|
62
|
80
|
66
|
94
|
98
|
102
|
82
|
26
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1939 |
184 |
| Teradyne, Inc. | 579 |
53 |
| ROHDE & Schwarz GmbH & Co. KG | 1831 |
35 |
| Texas Instruments Incorporated | 19376 |
24 |
| Tektronix, Inc. | 636 |
24 |
| Samsung Electronics Co., Ltd. | 131630 |
21 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
20 |
| International Business Machines Corporation | 60644 |
19 |
| Intel Corporation | 45621 |
15 |
| Qualcomm Incorporated | 76576 |
13 |
| Micron Technology, Inc. | 24960 |
12 |
| Anritsu Corporation | 380 |
11 |
| Infineon Technologies AG | 8189 |
10 |
| STMicroelectronics S.r.l. | 3693 |
10 |
| Analog Devices, Inc. | 3475 |
10 |
| Changxin Memory Technologies, Inc. | 4732 |
10 |
| SK Hynix Inc. | 11030 |
9 |
| Aehr Test Systems | 68 |
9 |
| Verigy (Singapore) Pte. Ltd. | 58 |
9 |
| Keithley Instruments, LLC | 72 |
8 |
| Other owners | 476 |